7 results
Trace Element Analyses by EMP: Pb-in-Monazite and New Multipoint Background Method
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 720-721
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- August 2014
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X-ray K-ratios Derived Using Extreme Overvoltage Conditions
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1268-1269
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- August 2013
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Near-Surface Chemical Alteration of Nineteenth-Century Architectural Cast Stone
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1416-1417
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- August 2013
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Electron Microprobe Quantitative Mapping vs. Defocused Beam Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 848-849
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- August 2013
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Mastering The Art Of Scientific Programming Or Application Development As A Tool For Scientific Innovation
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 808-809
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- August 2013
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Electron Backscattered Diffraction and Transmission Electron Microscopy Analysis of Ribbon Silicon
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1442-1443
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- July 2012
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The Effect of MASS in Electron-Solid Interactions and the Mystery of the “Heinrich Kink”
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 250-251
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- July 1998
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